The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Dec. 12, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kenneth M. Giffels, Mansfield, MA (US);

Christopher J. Karle, Wayland, MA (US);

William G. O'Keeffe, Tewksbury, MA (US);

Ketan T. Patel, Lowell, MA (US);

David D. Taieb, Charlestown, MA (US);

Sabrina Yee, Norfolk, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0769 (2013.01); G06F 11/34 (2013.01); G06F 11/3409 (2013.01);
Abstract

An approach is provided for monitoring the health of a Question/Answer (QA) Computing System. In the approach, performed by an information handling system, a number of static questions are periodically submitted to the QA system, wherein each of the static questions corresponds to a previously established verified answer. Responses are received from the QA system, with the responses including answers corresponding to the submitted static questions. Monitoring the performance of the QA system based on the received responses. When the monitoring detects a problem with the QA system, a user is notified of the detected problem.


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