The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Apr. 05, 2013
Applicants:

Shinichi Ishida, Odawara-shi, Kanagawa, JP;

Tsutomu Matsuzaki, Inagi-shi, Tokyo, JP;

I-system Co., Ltd., Chiyoda-ku, Tokyo, JP;

Inventor:

Shinichi Ishida, Odawara, JP;

Assignees:

I-SYSTEM CO., LTD., Tokyo, JP;

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01); G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 8/75 (2013.01); G06F 11/3604 (2013.01);
Abstract

A structure analysis device comprises a storage means wherein modules are stored, and an analysis means for carrying out a structural analysis of a prescribed subject module of the modules which are stored in the storage means. If a hierarchical structure of a first subject range and a hierarchical structure of a second subject range of the subject module are the same, the analysis means creates similarity notification information in association with the first subject range and/or the second subject range. The first subject range and the second subject range are respectively different subject ranges of the subject ranges of the subject modules which are acquired from the storage means. The similarity notification information denotes that respectively similar subject ranges are present in the subject module.


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