The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Jul. 30, 2014
Applicants:

Takahiro Konishi, Kanagawa, JP;

Yoshiaki Morita, Kanagawa, JP;

Inventors:

Takahiro Konishi, Kanagawa, JP;

Yoshiaki Morita, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G03G 15/55 (2013.01); G03G 15/5004 (2013.01); G01R 31/00 (2013.01);
Abstract

An abnormality monitoring system includes: an electronic component that outputs a lock signal of 'High' when the electronic component stops functioning and outputs a lock signal of 'Low' when the electronic component functions; a signal device that supplies power to the electronic component and outputs an ON operation signal instructing the electronic component to function and an OFF operation signal instructing the electronic component to stop functioning; a harness member that connects the electronic component and the signal device and transmits and receives a signal; and a monitor device that determines abnormality of the electronic component when the operation signal is ON and the lock signal is “Low”, and determines abnormality of the harness member when the operation signal is OFF and the lock signal is “Low”.


Find Patent Forward Citations

Loading…