The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Dec. 08, 2009
Applicants:

Martin A. Perlmutter, Houston, TX (US);

Michael J. Pyrcz, Humble, TX (US);

Inventors:

Martin A. Perlmutter, Houston, TX (US);

Michael J. Pyrcz, Humble, TX (US);

Assignee:

Chevron U.S.A. Inc., San Ramon, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G01V 11/00 (2006.01);
U.S. Cl.
CPC ...
G01V 11/00 (2013.01); G01V 2210/665 (2013.01);
Abstract

A system for and computer implemented method for analysis of data representative of subsurface properties of a subsurface region. The method includes transforming the data representative of subsurface properties of the subsurface region into transformed data in accordance with a selected criterion. A three dimensional window geometry to be applied to the transformed data is selected, based, at least in part, on expected feature sizes present, data sampling density and a size of the subsurface region. A plurality of values for a three dimensional lacunarity statistic are calculated by applying the selected three dimensional window geometry to randomly selected regions of the subsurface region, and correlating the calculated values to the subsurface properties of the subsurface region.


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