The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Jul. 25, 2014
Applicants:
Nitin Singh, New Delhi, IN;
Amit Jindal, Sonipat, IN;
Anurag Jindal, Patiala, IN;
Inventors:
Assignee:
FREESCALE SEMICONDUCTOR,INC., Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3185 (2006.01); G01R 31/3177 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01);
Abstract
A controller executes a first LBIST test on a device at a first shift frequency on a plurality of partitions and detects any voltage drop at sense points in each partition during the test. If a voltage drop is detected, then the test is re-run for those partitions that failed the first test. If failures are detected during the re-execution, then a further test at a lower shift frequency is performed. The partitions can be tested sequentially or in parallel and invention has the advantage of reducing the time taken for executing LBIST when the device is booted.