The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9285423 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 15, 2016

Filed:

Dec. 16, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Steven M. Douskey, Rochester, MN (US);

Ryan A. Fitch, Southfield, MI (US);

William V. Huott, Holmes, NY (US);

Mary P. Kusko, Hopewell Junction, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/3177 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3177 (2013.01); G01R 31/318544 (2013.01); G01R 31/318541 (2013.01);
Abstract

A system and method of a test structure for testing a chip is disclosed. The system may include a scan channel comprising a plurality of scannable latches. The scan channel may be configured to scan input data to apply to logic circuits on a chip and further configured to receive outputs from logic circuits on the chip. The system may further include, a storage configured to store unmodified a selected bit of the scan channel during a scan out of the scan channel.


Find Patent Forward Citations

Douskey, Steven. (2016). Managing chip testing data (U.S. Patent No. 9285423). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9285423

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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