The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Jan. 22, 2014
Mirae Corporation, Cheonan-si, Chungcheongnam-do, KR;
Kyung Tae Kim, Suwon-si, KR;
Chan Ho Park, Cheonan-si, KR;
Jae Gue Lee, Seoul, KR;
Ung Hyun Yoo, Suwon-si, KR;
Hae Jun Park, Cheonan-si, KR;
Kook Hyung Lee, Suwon-si, KR;
Hyun Chae Chung, Suwon-si, KR;
Jang Yong Park, Suwon-si, KR;
MIRAE CORPORATION, Cheonan-Si, KR;
Abstract
Disclosed is an apparatus for spinning a test tray and an in-line test handler including the above apparatus, wherein the apparatus may include a supporting unit for supporting a test tray transported between first and second chamber units facing in the different directions, wherein the first chamber unit is provided at a predetermined interval from the second chamber unit; a base unit to which the supporting unit is spinnably connected; and a spinning unit which spins the test tray so that semiconductor devices received in the test tray are tested at the same arrangement in each of the first chamber unit and the second chamber unit.