The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Sep. 11, 2013
Applicants:
Hiroto Toyoshima, Kobe, JP;
Kouichi Masutani, Kobe, JP;
Inventors:
Hiroto Toyoshima, Kobe, JP;
Kouichi Masutani, Kobe, JP;
Assignee:
SYSMEX CORPORATION, Hyogo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/04 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/04 (2013.01); G01N 2035/0406 (2013.01); G01N 2035/0465 (2013.01); G01N 2035/103 (2013.01);
Abstract
A specimen analyzer comprises a measurement mechanism section configured to measure a specimen by using a first consumable and a second consumable having a shape different from a shape of the first consumable, a first inlet for loading the first consumable, a supplying section configured to supply the first consumable loaded through the first inlet, to the measurement mechanism section, a sorter configured to sort the first consumable and the second consumable from each other, and a storage for housing the second consumable sorted by the sorter.