The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Mar. 14, 2014
Applicants:

Ching Wu, Boxborough, MA (US);

Christopher Hilton, Reno, NV (US);

Inventors:

Ching Wu, Boxborough, MA (US);

Christopher Hilton, Reno, NV (US);

Assignee:

Excellims Corporation, Acton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01); G01N 27/62 (2006.01); C07B 63/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/624 (2013.01); C07B 63/00 (2013.01);
Abstract

One aspect of the present invention is to extract multiple ionic species in a FAIMS into one or more IMS drift tubes simultaneously. By adjusting FAIMS operational parameters, ions in FAIMS are detected on IMS detectors through separation in FAIMS and/or separation and collection in the IMS. This method provides a continuous separation of specific ions from an ion swarm by employing a high-field differential mobility analyzer (FAIMS) with a plurality of orthogonal transitions paths spaced incrementally along the electrodes which allow additional separation by a conventional IMS drift tube. The components of the sample can be collected or detected.


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