The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Sep. 04, 2012
Applicant:

Tomoyoshi Sato, Tsukúba, JP;

Inventor:

Tomoyoshi Sato, Tsukúba, JP;

Assignee:

ATONARP INC., Hachioji-Shi, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/62 (2006.01); G01M 5/00 (2006.01);
U.S. Cl.
CPC ...
G01N 27/622 (2013.01); G01M 5/0025 (2013.01); G01M 5/0033 (2013.01); G01M 5/0075 (2013.01); G01N 27/62 (2013.01);
Abstract

There is provided a monitoring apparatus that monitors abnormalities in a system including a plurality of components or products. The plurality of components or products respectively include a plurality of types of microcapsules that release, due to specific causes, a plurality of marker chemical substances respectively, the marker chemical substances having respectively different ion mobilities. The monitoring apparatus includes an ion mobility sensor that detects the plurality of marker chemical substances. By detecting the marker chemical substances, the monitoring apparatus is capable of identifying the occurrence of an abnormal state, the type of abnormal state, the occurrence location, the extent of the abnormal state, and the like.


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