The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Feb. 06, 2013
Applicant:
Zhengrong Ying, Belmont, MA (US);
Inventor:
Zhengrong Ying, Belmont, MA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); G01N 23/04 (2006.01); G01T 1/29 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); A61B 6/032 (2013.01); A61B 6/4233 (2013.01); A61B 6/4291 (2013.01); G01T 1/2985 (2013.01); A61B 6/4085 (2013.01); A61B 6/5258 (2013.01); A61B 6/585 (2013.01); G01N 2223/419 (2013.01);
Abstract
An Adjustable Photon Detection System (APDS) for multi-slice X-ray CT systems and a multi-slice X-ray CT system using the APDS are disclosed; wherein the APDS can be adjusted to be aligned to different X-ray source positions; wherein the multi-slice X-ray CT system comprises one or more X-ray sources, and one or more APDS; wherein the multi-slice X-ray CT system may also include a detector position calculator for calculating effective detector positions and a detector position corrector for correcting projection data using calculated effective detector positions.