The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Oct. 12, 2012
Brown University, Providence, RI (US);
Domenico Pacifici, Providence, RI (US);
Henri J. Lezec, Bethesda, MD (US);
Tayhas G. r. Palmore, Providence, RI (US);
Vince Siu, Thornhill, CA;
Vihang Mehta, Pune, IN;
Alec Roelke, Basking Ridge, NJ (US);
Steve Rhieu, Rockville, MD (US);
Jing Feng, Jiangsu, CN;
Brown University, Providence, RI (US);
Abstract
System and methods for detecting analytes are provided. The system includes a plasmonic interferometer with a first surface having a first and second scattering element and an aperture disposed between the first scattering element and the second scattering element. A first distance between the aperture and the first scattering element and a second distance between the aperture and the second scattering element are selected to provide interference of light at the slit. The system also includes a light source for illuminating the first surface of the plasmonic interferometer, a detector positioned for detecting light transmitted through the aperture, and a sample holder for disposing a sample to be analyzed onto the first surface of the plasmonic interferometer.