The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Dec. 06, 2010
Nobuyuki Takegawa, Tokyo, JP;
Takayuki Nakamura, Tokyo, JP;
Yuuki Sameshima, Tokyo, JP;
Masahiko Takei, Tokyo, JP;
Noritomo Hirayama, Tokyo, JP;
Nobuyuki Takegawa, Tokyo, JP;
Takayuki Nakamura, Tokyo, JP;
Yuuki Sameshima, Tokyo, JP;
Masahiko Takei, Tokyo, JP;
Noritomo Hirayama, Tokyo, JP;
THE UNIVERSITY OF TOKYO, Tokyo, JP;
FUJI ELECTRIC CO., LTD., Kanagawa, JP;
Abstract
A method of analyzing microparticle compositions and a microparticle composition analyzing device are capable of quantitatively analyzing the mass concentration of air microparticles online for each chemical composition. The particle ray of microparticles in an air sample is converged, and is irradiated onto a narrow domain of a capture body which includes a mesh-shaped structure for capturing the microparticles in the particle ray while removing surplus gas phase components, and the microparticles are captured. Then, the narrow region is subjected to concentrated irradiation of energy rays, and the microparticles that are captured by the capture body are vaporized, sublimated or reacted to yield a desorbed component, which is analyzed.