The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Sep. 11, 2012
Hung A. Pham, Oakland, CA (US);
Hengliang Zhang, Sunnyvale, CA (US);
Hung A. Pham, Oakland, CA (US);
Hengliang Zhang, Sunnyvale, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Implementations are disclosed for using magnetometer measurements to estimate bias for angular rate measurements provided by an angular rate sensor (e.g., a gyro sensor). In some implementations, a bias estimator running on a device is configured to determine if the device is rotating based on the magnetometer measurements. If the device is not rotating, a dynamic bias is calculated and added to a temperature compensated static bias to provide a total angular rate measurement bias. The total angular rate measurement bias can be provided to an attitude estimation system where it is used to update an attitude (orientation) of the device. In some implementations, the angular rate measurements are used to determine if the device is oscillating according to a threshold value. If the device is not rotating and the device is oscillating according to a threshold value, the static bias is updated in a calibration table.