The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2016
Filed:
Jul. 26, 2013
Applicant:
Invensense, Inc., Sunnyvale, CA (US);
Inventors:
Baris Cagdaser, Sunnyvale, CA (US);
Du Chen, San Jose, CA (US);
Hasan Akyol, Mountain View, CA (US);
Derek Shaeffer, Redwood City, CA (US);
Assignee:
INVENSENSE, INC., San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/14 (2006.01); G01D 5/241 (2006.01); G01D 5/24 (2006.01);
U.S. Cl.
CPC ...
G01B 7/14 (2013.01); G01D 5/24 (2013.01); G01D 5/2412 (2013.01);
Abstract
A method and system for measuring displacement of a structure is disclosed. The method and system comprise providing a first capacitance and providing a second capacitance. The first and second capacitances share a common terminal. The method and system further include determining a difference of the inverses of the value of the first and second capacitances when the structure is displaced. The first capacitance varies in inverse relation to the displacement of the structure.