The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Sep. 13, 2013
Applicant:

Lockheed Martin Corporation, Bethesda, MD (US);

Inventors:

Jonathan A. Boardman, Mount Laurel, NJ (US);

Jeffrey B. Boka, Lumberton, NJ (US);

Naresh R. Patel, Mullica Hill, NJ (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F41G 7/22 (2006.01); F41G 7/00 (2006.01);
U.S. Cl.
CPC ...
F41G 7/008 (2013.01); F41G 7/22 (2013.01); F41G 7/2246 (2013.01); F41G 7/2253 (2013.01); F41G 7/2286 (2013.01); F41G 7/2293 (2013.01);
Abstract

A system and method for performing correlation processing for identifying an object of interest in a cloud of remote objects of different types comprises receiving RF and IR measurement data including rotational, translational bias and noise errors and determining and removing biases by minimizing a weighted distance metric. Correlation pairing metrics are then determined according to a maximum likelihood criteria. This method produces a correlation solution that minimizes the effects of biases and random noise while accounting for the statistical properties of the parameters being estimated.


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