The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

May. 27, 2014
Applicant:

Brother Kogyo Kabushiki Kaisha, Nagoya-shi, JP;

Inventors:

Yoko Yamanashi, Konan, JP;

Mika Matsushima, Ichinomiya, JP;

Masayuki Hori, Gifu, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 11/66 (2006.01); B26D 5/00 (2006.01); G06F 19/00 (2011.01); G05B 19/409 (2006.01);
U.S. Cl.
CPC ...
B26D 5/005 (2013.01); G05B 19/409 (2013.01); G05B 2219/37269 (2013.01); G05B 2219/45038 (2013.01); Y10T 83/175 (2015.04);
Abstract

An apparatus includes an information obtaining device configured to obtain information representing an optionally designated position on an object, a projector, a processing device, a pattern specifying device and a control device. The control device is configured to cause the apparatus to specify two designated positions on an object based on information obtained by the information obtaining device, to change a size of a specified pattern according to a distance between the specified designated positions, to cause the projector to project a marker onto the object in a size matched with the changed size of the pattern, based on the specified designated positions on the object, to determine a cutting or printing position of the pattern based on the specified designated positions on the object and to control the processing device to perform cutting or printing of the pattern in the changed size at the determined cutting or printing positions.


Find Patent Forward Citations

Loading…