The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2016

Filed:

Mar. 01, 2013
Applicant:

Tomey Corporation, Nagoya, JP;

Inventors:

Chihiro Kato, Nagoya, JP;

Yuji Nozawa, Nagoya, JP;

Assignee:

TOMEY CORPORATION, Nagoya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0008 (2013.01); A61B 3/102 (2013.01); A61B 3/1005 (2013.01); A61B 3/12 (2013.01);
Abstract

An ophthalmic apparatus is provided with a light source, an optical measurement system, an optical reference system, an optical calibration system, a light receiving element, and a processor. The light receiving element receives an interference light for measurement produced by both the reflected light guided by the optical measurement system and the reference light guided by the optical reference system, and also receives an interference light for calibration produced by the calibration light guided by the optical calibration system and the reference light guided by the optical reference system. The processor determines a position of a measuring portion inside an eye to be examined by Fourier-analyzing the interference light for measurement and the interference light for calibration.


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