The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2016
Filed:
May. 31, 2013
Flextronics International Usa, Inc., San Jose, CA (US);
Galen Murray, Northfield, MN (US);
Kevin Corrigan, Burnsville, MN (US);
Edward Mahagnoul, Fairbault, MN (US);
Flextronics International USA, Inc., San Jose, CA (US);
Abstract
Alignment markers are added to each layer of a multiple layer substrate for proper alignment. Optical alignment markers are applied on the surface of each substrate layer. Groups of alignment markers are arranged in localized areas on each substrate layer. Each localized group of alignment markers are referred to as alignment target areas. The alignment markers in a first alignment target area on the first substrate layer are to be aligned with corresponding alignment markers in a second alignment target area on the second substrate layer. In some embodiments, the first alignment target area includes an alignment marker configured for manual alignment and another alignment marker configured for machine alignment. The second alignment target area has a corresponding manual alignment marker and machine alignment marker.