The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Jul. 24, 2014
Applicant:

Optikos Corporation, Wakefield, MA (US);

Inventors:

Stephen D Fantone, Lynnfield, MA (US);

Daniel Orband, Boxford, MA (US);

David Paul Biss, Brighton, MA (US);

Assignee:

Optikos Corporation, Wakefield, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01);
Abstract

Apparatus for evaluating optical components and systems that uses a precision compact mirror support structure to present to an optical system or electro-optical system (e.g., a camera) multiple images of at least one optical evaluation target over a wide field to allow assessment of the performance or alignment of the optical or electro-optical system over its intended field of use. The mirror support structure generates multiple images of an optical evaluation target by providing multiple folded optical paths between the target and the desired field locations of the test optic. The mirrors employed may either be parallel or at angles with respect to one another.


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