The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2016
Filed:
Dec. 10, 2012
Applicant:
Fluke Corporation, Everett, WA (US);
Inventor:
Kirk R. Johnson, Rogers, MN (US);
Assignee:
Fluke Corporation, Everett, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); H04N 5/232 (2006.01); H04N 5/235 (2006.01);
U.S. Cl.
CPC ...
H04N 5/33 (2013.01); H04N 5/2355 (2013.01); H04N 5/23254 (2013.01); H04N 5/23274 (2013.01); H04N 5/23277 (2013.01); H04N 5/332 (2013.01);
Abstract
Devices and methods for generating infrared (IR) images with improved quality are disclosed. In embodiments of the invention, temporal averaging techniques are used to reduce temporal noise that may be present in thermal images. This is especially useful in low-contrast thermal scenes, where a relatively small amount of thermal noise may become exceedingly prevalent. In order to average properly, some embodiments of the invention provide methods or means for aligning multiple images that are to be averaged together to eliminate inaccuracies and misrepresentations that may result from averaging misaligned images.