The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Jun. 30, 2011
Applicant:

Patryk Urban, Vallingby, SE;

Inventor:

Patryk Urban, Vallingby, SE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01); H04B 10/071 (2013.01); G01M 11/00 (2006.01); H04B 10/077 (2013.01); H04B 10/27 (2013.01);
U.S. Cl.
CPC ...
H04B 10/071 (2013.01); G01M 11/3136 (2013.01); G01M 11/3145 (2013.01); H04B 10/0771 (2013.01); H04B 10/27 (2013.01);
Abstract

Fault analysis of a Passive Optical Network comprising Optical Network Terminal(s) uses Optical Time Domain Reflectometry (OTDR). An OTDR measurement signal is supplied to a multistage splitter having a ratio 2:N. At least one drop link which is connected to the multistage splitter comprises one or more sub-splitters which having a ratio 1:N. A new event location is determined based on the OTDR measurement signal by analyzing OTDR measurement data relating to the sub-splitter based on distance from the multistage splitter and to the sub-splitter. A fault magnitude is calculated for a given location by subtracting an event magnitude obtained from the new OTDR measurement from a reference OTDR measurement and taking into account the number of drop links connected to the last splitter stage and to the sub-splitter in the reference measurement and the new measurement, thereby enabling determination of position and severity of the fault locations.


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