The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Oct. 29, 2015
Applicant:

Iq-analog Corporation, San Diego, CA (US);

Inventor:

Mikko Waltari, Escondido, CA (US);

Assignee:

IQ-Analog Corporation, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1023 (2013.01); H03M 1/121 (2013.01); H03M 1/1245 (2013.01);
Abstract

A system and method are provided for calibrating timing mismatch in an n-path time interleaved analog-to-digital converter (ADC). The method digitizes an analog signal with an n-path interleaved ADC, creating an interleaved ADC signal. In a first process, the phase of the interleaved ADC signal is rotated by 90 degrees, creating a rotated signal. This rotation may be accomplished using a finite impulse response (FIR) filter with taps at {0.5, 0, −0.5}, enabled as a derivative filter, or as a Hilbert transformation. In a parallel second process, the interleaved ADC signal is delayed, creating a delayed signal. The rotated signal is multiplied by the delayed signal to create a timing error signal. Using the timing error signal, timing errors are accumulated for the ADC signal paths, and corrections are applied that minimize timing errors in each of the n ADC signal paths.


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