The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

May. 28, 2012
Applicants:

Bruce Walter Mcneill, Yokohama, JP;

Peter John Windler, Fort Collins, CO (US);

Wei T. Lim, Fort Collins, CO (US);

Inventors:

Bruce Walter McNeill, Yokohama, JP;

Peter John Windler, Fort Collins, CO (US);

Wei T. Lim, Fort Collins, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01); H03M 1/06 (2006.01); G01K 7/24 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
H03M 1/0619 (2013.01); G01K 7/24 (2013.01); G01K 2219/00 (2013.01); H03M 1/12 (2013.01);
Abstract

A measurement circuit is provided for measuring the resistance of a variable resistance element biased with an external voltage supply. The measurement circuit includes an analog-to-digital converter (ADC) and a reference generator connected with the ADC. The ADC is operative to receive a reference voltage and a first voltage developed across the variable resistance element, and to generate a digital output signal indicative of a relationship between the first voltage and the reference voltage. The reference generator is operative to generate the reference voltage as a function of the external voltage supply.


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