The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Sep. 09, 2011
Applicants:

Zhenan Bao, Stanford, CA (US);

Stefan Christian Bernhardt Mannsfeld, Palo Alto, CA (US);

Jason Locklin, Bogart, GA (US);

Benjamin Chee-keong Tee, Stanford, CA (US);

Inventors:

Zhenan Bao, Stanford, CA (US);

Stefan Christian Bernhardt Mannsfeld, Palo Alto, CA (US);

Jason Locklin, Bogart, GA (US);

Benjamin Chee-Keong Tee, Stanford, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); H01L 29/84 (2006.01); G01L 1/14 (2006.01); H01L 51/00 (2006.01); H01L 51/05 (2006.01);
U.S. Cl.
CPC ...
H01L 29/84 (2013.01); G01L 1/146 (2013.01); G01L 1/148 (2013.01); H01L 51/0055 (2013.01); H01L 51/0541 (2013.01); Y10T 29/49002 (2015.01); Y10T 156/10 (2015.01);
Abstract

Sensors, sensing arrangements and devices, and related methods are provided. In accordance with an example embodiment, an impedance-based sensor includes a flexible dielectric material and generates an output based on pressure applied to the dielectric material and a resulting compression thereof. In certain embodiments, the dielectric material includes a plurality of regions separated by gaps and configured to elastically deform and recover in response to applied pressure.


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