The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Jul. 08, 2015
Applicant:

Applied Underwriters, Inc., Omaha, NE (US);

Inventors:

David Alan Clark, San Mateo, CA (US);

Justin N. Smith, Woodside, CA (US);

Assignee:

Applied Underwriters, Inc., Omaha, NE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 5/04 (2006.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 99/005 (2013.01);
Abstract

An artificial intelligence expert system for screening provides characteristic profiles to candidates to perform a particular task. The profiles have individual screening items within them that are expected to be related to whether or not a person is suitable for the task. The responses from the persons to the items are received by a computer implemented expert system. The expert system applies a combined model to the responses to generate a forecasted performance of the person to the task. The combined model is a linear combination of two or more path dependent regressions performed on data from a set of N training persons with known abilities to do the task. The number of parameters in each path dependent model is limited to a fraction of the number N so that the path dependent models are not over fit to the data. A suitable fraction is ⅕.


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