The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Apr. 30, 2012
Applicants:

Yusuke Suga, Kobe, JP;

Naoki Shindo, Palatine, IL (US);

Atsumasa Sone, Akashi, JP;

Hiroyuki Koyama, Kobe, JP;

Shunsuke Ariyoshi, Kobe, JP;

Inventors:

Yusuke Suga, Kobe, JP;

Naoki Shindo, Palatine, IL (US);

Atsumasa Sone, Akashi, JP;

Hiroyuki Koyama, Kobe, JP;

Shunsuke Ariyoshi, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G06F 19/00 (2011.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G06F 19/366 (2013.01); G01N 35/00623 (2013.01); G01N 35/00871 (2013.01); G05B 2219/24001 (2013.01); G05B 2219/2657 (2013.01);
Abstract

A management system connected with a clinical testing apparatus is disclosed. The system acquires, from the clinical testing apparatus, a parameter that varies according to deterioration of the unit at a plurality of points of time, stores the parameters and/or analysis results that are obtained by analyzing the parameters, and provides a screen data for showing the stored parameters and/or the stored analysis results in a time-series format. A method for managing a clinical testing apparatus and a clinical testing system for the method are also disclosed.


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