The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2016
Filed:
Oct. 16, 2012
Christian Amann, Bottrop, DE;
Phillip W. Gravett, Orlando, FL (US);
Kai Kadau, Clover, SC (US);
SIEMENS AKTIENGESELLSCHAFT, München, DE;
Abstract
A probabilistic estimation of fatigue crack life of a component is provided. A plurality of representations of the component is defined from material property scatter data and flaw-size scatter data, wherein each representation is defined by one possible material condition and flaw-size condition associated with the component. For each representation, a component location is selected and a determination is made whether said individual representation fails after a given number of cycles N, based on the calculation of a crack growth in the selected location. The crack growth is calculated on the basis of the material condition and the flaw-size condition in the selected location. Failure of the individual representation is determined if the crack growth is determined to be unstable. The sum total of the number of the representations that failed after N cycles is determined. A probability of failure of the component after N cycles is then determined.