The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2016
Filed:
Jun. 26, 2013
Amazon Technologies, Inc., Reno, NV (US);
Prasad Ramani Mahadevan, Tamil Nadu, IN;
Venkatesh Kancharla, Tamil Nadu, IN;
Sai Vinayak, Tamil Nadu, IN;
Deepa Subramanian Iyer, Tamil Nadu, IN;
Amazon Technologies, Inc., Reno, NV (US);
Abstract
This disclosure relates to systems and methods for generating test cases. In one embodiment, a method is provided that may include identifying, by a computer including one or more processors, a first test event associated with a first user interaction with a first test device. The first user interaction may include interaction with a first display displaying a plurality of applications on the first test device. The method may also include determining, by the computer, at least one first view in which the first test event occurs. Furthermore, the method may include determining, based at least in part on the first test event, a first state of the first test device. Additionally, the method may include storing information about the first test event, the at least one first view, and the first state of the first test device in a first test case.