The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Mar. 18, 2013
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Kensuke Kobayashi, Tokyo, JP;

Shigeru Horikawa, Tokyo, JP;

Kaichirou Ozeki, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08C 25/02 (2006.01); H04L 1/18 (2006.01); G06F 11/34 (2006.01); G06F 13/00 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3495 (2013.01); G06F 13/00 (2013.01); H04L 43/0847 (2013.01);
Abstract

A monitoring target apparatus connected to a plurality of monitoring manager apparatuses is characterized in that the monitoring target apparatus includes, in a memory, a monitoring agent for collecting monitoring information from monitoring target resources among resources constituting the monitoring target apparatus; and monitoring condition management information that defines an event issuance condition for each type of the monitoring target resources; wherein the monitoring agent judges whether to issue an event or not, based on the monitoring information and the monitoring condition management information; and if the monitoring agent issues the event, it transmits the issued event to all the plurality of monitoring manager apparatuses.


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