The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Feb. 21, 2014
Applicants:

Continental Automotive France, Toulouse, FR;

Continental Automotive Gmbh, Hannover, DE;

Inventors:

Stephan Baudru, Pins Justaret, FR;

Olivier Elie, Toulouse, FR;

Maxime Cordier, Toulouse, FR;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); G01R 27/26 (2006.01); H03K 17/955 (2006.01); H03K 17/96 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01); G01R 27/2605 (2013.01); H03K 17/955 (2013.01); H03K 17/962 (2013.01); H03K 2217/94026 (2013.01); H03K 2217/960705 (2013.01); H03K 2217/960715 (2013.01);
Abstract

Method of searching for a variation in capacitance of a capacitive sensor, includes a phase of searching for variation in capacitance and, when a capacitance variation has been detected, a phase of verifying the variation in capacitance. The search phase includes a recurrent step of searching for variation in capacitance including steps of measuring the duration of a first measurement sequence and determining, according to the measured duration, whether a first predefined detection criterion for variation in capacitance is verified. The verification phase includes steps of measuring the duration of a second measurement sequence and determining, according to the measured duration, whether a second predefined detection criterion for variation in capacitance is verified. The first measurement sequence has a reference duration less than that of the second measurement sequence, and the verification phase includes, when the second detection criterion is not verified, a step of updating the first detection criterion.


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