The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Aug. 16, 2012
Applicants:

Chun-yen Tsai, Hsinchu County, TW;

Nien-tsung Hsueh, Hsinchu County, TW;

Inventors:

Chun-Yen Tsai, Hsinchu County, TW;

Nien-Tsung Hsueh, Hsinchu County, TW;

Assignee:

NOVATEK Microelectronics Corp., Hsinchu Science Park, Hsin-Chu, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01); G01R 3/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07378 (2013.01); G01R 31/2889 (2013.01); G01R 3/00 (2013.01);
Abstract

A probe card includes a circuit board and an integrated circuit (IC) test interface. The IC test interface includes a first probe assembly, disposed on a terminal of the circuit board, and a second probe assembly, disposed on another terminal of the circuit board, wherein the first probe assembly and the second probe assembly are separated to allow being independently assembled to, or disassembled from, the circuit board. Each of the first probe assembly and the second probe assembly includes a probe base, disposed on the circuit board; a plurality of needles, which are cantilever needles; and a covering layer, for covering the plurality of needles, and fixed on a surface of the probe base.


Find Patent Forward Citations

Tsai, Chun-Yen. (2016). Probe card and fabricating method thereof (U.S. Patent No. 9279831). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9279831

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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