The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2016
Filed:
Jan. 30, 2015
Oregon State University, Corvallis, OR (US);
Joseph Beckman, Corvallis, OR (US);
Wei Kong, Corvallis, OR (US);
Valery G. Voinov, Corvallis, OR (US);
William M. Freund, Corvallis, OR (US);
Oregon State University, Corvallis, OR (US);
Abstract
Certain disclosed embodiments concern a method and an apparatus for determining molecular structure. One embodiment comprises producing sample ions from a sample, cooling molecules of the sample ions by either embedding sample ions in superfluid droplets, such as superfluidic helium droplets, or subjecting sample ions in a cooled ion trap, to a selected temperature approaching absolute zero. Plural cooled sample ions confined in a diffraction zone are oriented using a laser, and a diffraction image is produced from oriented sample ions using an electron beam. Molecular structure is determined using collected images from different orientations obtained under different polarization directions of the orientation laser. Embodiments of an apparatus for determining molecular structure also are disclosed. The apparatus operation, data accumulation and processing are controlled by software. The software can directly calculate electron density maps without using heavy atom derivatives or multi-wavelength anomalous dispersion phasing methods.