The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Sep. 11, 2012
Applicant:

Osamu Tsujii, Kawasaki, JP;

Inventor:

Osamu Tsujii, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); A61B 6/4007 (2013.01); A61B 6/4028 (2013.01); A61B 6/4441 (2013.01); A61B 6/587 (2013.01); A61B 6/589 (2013.01); G01N 23/04 (2013.01); A61B 6/4021 (2013.01);
Abstract

An X-ray imaging apparatus includes an X-ray source including a plurality of X-ray focuses, an X-ray detector which detects X-rays emitted from the X-ray focuses and transmitted through an object, and a control unit which controls the X-ray source and the X-ray detector. The X-ray imaging apparatus selects a pair of X-ray focuses, of X-ray focuses of the plurality of X-ray focuses which project images on the X-ray detector through a region of interest which is an imaging region of the object, from which emitted X-rays define an intersecting angle coinciding with a predetermined angle in the region of interest, and decides an X-ray focus to be used for imaging from X-ray focuses between the selected pair of X-ray focuses. An X-ray image is captured by emitting X-rays from the decided X-ray focus and causing the X-ray detector to detect the X-rays.


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