The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2016
Filed:
Mar. 20, 2015
Applicant:
Process Metrix, Pleasanton, CA (US);
Inventor:
Thomas Lawrence Harvill, Alamo, CA (US);
Assignee:
PROCESS METRIX, Pleasanton, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/90 (2006.01); G01S 17/02 (2006.01); G01B 11/30 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/90 (2013.01); G01B 11/303 (2013.01); G01N 21/8806 (2013.01); G01S 17/02 (2013.01);
Abstract
Apparatuses, methods, and systems are disclosed to detect and measure cracks in the lining of a container. A typical apparatus includes a scanning device to acquire a cloud of data points by measuring distances from the scanning device to a plurality of points on the surface of lining material and a controller to fit a polygonal mesh and a minimum surface through the cloud of data points, a crack being detected by a portion of the polygonal mesh containing a connected group of polygons that extends past the minimum surface beyond a threshold distance.