The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9279742 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 08, 2016

Filed:

Mar. 14, 2014
Applicant:

Insight Photonic Solutions, Inc., Lafayette, CO (US);

Inventors:

Michael Minneman, Lafayette, CO (US);

Michael Crawford, Lafayette, CO (US);

Jason Ensher, Lafayette, CO (US);

Assignee:

Insight Photonic Solutions, Inc., Lafayette, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/33 (2013.01);
Abstract

A system and method including a semiconductor laser source configured to output radiation over a range of wavelengths at a prescribed rate to a device under test. The prescribed rate is sufficiently above environmental frequency bands. A detector is configured to detect output radiation from the device under test to obtain a detected signal associated with at least one physical property associated with the incident radiation over the range of wavelengths at the prescribed rate. The detected signal includes environmental signal and target signal from the device under test. A processor isolates the environmental signal from the detected signal; and processes the target signal to obtain dispersion information of the device under test. A system output is configured to output the dispersion information of the device under test.


Find Patent Forward Citations

Minneman, Michael. (2016). System and method of measurement frequency shifting to isolate external environmental conditions for interferometric dispersion measurements (U.S. Patent No. 9279742). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9279742

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…