The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2016
Filed:
Mar. 04, 2015
Bruker Optik Gmbh, Ettlingen, DE;
Sven Krause, Hamburg, DE;
Yifei Wang, Hamburg, DE;
Lars Schomann, Hamburg, DE;
Gerhard Matz, Buchholz, DE;
Roland Harig, Waldbronn, DE;
Jens Eichmann, Hamburg, DE;
Bruker Optik GmbH, Ettlingen, DE;
Abstract
A measuring cell for a gas analysis spectrometer has an inner chamber for a sample gas to be analyzed and an inlet and an outlet which are connected thereto. A traversing optical path for a measuring beam is formed in the inner chamber. The measuring cell is tubular, the inlet and the outlet are arranged at opposite ends, and the inner chamber of the measuring cell has a cross-sectional shape that is monotonic over the length of the tube and which has an oval-shape at the start, which disappears toward the end. That special shape results in fast gas exchange and thus high dynamics, even with larger measuring cells, which have high sensitivity due to the long optical paths thereof. Two characteristics which until now appeared to be conflicting are thereby combined.