The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2016

Filed:

Dec. 02, 2014
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Mahadevan Balasubramaniam, Ballston Lake, NY (US);

Slawomir Rubinsztajn, Ballston Spa, NY (US);

Glen Peter Koste, Niskayuna, NY (US);

Kaustubh Ravindra Nagarkar, Clifton Park, NY (US);

Vincent Frank Rubino, Stow, OH (US);

Jeffrey Roy Rudd, Akron, OH (US);

Paul Jeffrey Gillespie, Scotia, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); G01B 11/16 (2006.01);
U.S. Cl.
CPC ...
G01B 11/165 (2013.01);
Abstract

A system is provided for monitoring strain in a substrate using a strain sensor element within a fiber optic sensing cable. Accurate and rapid measurement of strain of remote substrates presents major technical challenges and is the focus of much of the description presented. However, systems, methods and devices provided by the present invention are not only capable of reliably measuring strain in real time, but are also capable of measuring other characteristics of a substrate such as its temperature, pressure and its acoustic characteristics. The system is configured such that a strain sensor element within a strain sensing zone detects substantially the true strain characteristics of the substrate. And while other sensing elements within the same fiber optic sensing cable may not be configured to detect substrate strain at all, these sensing elements may reliably measure the temperature and pressure at the surface of the substrate adjacent to the strain sensing zone.


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