The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2016
Filed:
Jan. 18, 2013
Fanuc Corporation, Yamanashi, JP;
Yonpyo Hon, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A shape measurement data is acquired by measuring along a spiral measurement path a lens shape which is machined along a spiral machining path. An interpolated shape measurement data at intersecting points of a radial line passing through a center of the lens shape and the spiral measurement path is acquired by interpolating the shape measurement data, and a compensated machining amount for removing a machining error at each of the intersecting points (the machining points) is calculated from the interpolated shape measurement data by interpolation. Further, a machining point compensated machining amount at each of the machining points on the spiral machining path is calculated from the calculated compensated machining amount, and a compensated machining path is created on the basis of the machining point compensated machining amount.