The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2016

Filed:

Dec. 03, 2014
Applicant:

Marvell International Ltd., Hamilton, BM;

Inventors:

Vladan Petrovic, San Jose, CA (US);

Christian R. Berger, San Jose, CA (US);

Zhipei Chi, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 15/00 (2006.01); H04W 24/00 (2009.01); H04W 52/22 (2009.01);
U.S. Cl.
CPC ...
H04W 24/00 (2013.01); H04B 15/00 (2013.01); H04W 52/225 (2013.01);
Abstract

Systems, methods, and other embodiments associated with estimating noise in a receiver device based on related properties of order statistics are described. According to one embodiment, a method includes generating an initial set of magnitude squared values from a time domain impulse response of a receiver device. The method also includes generating an initial noise power estimate based on a modified set of magnitude squared values and generating a threshold value based on the initial noise power estimate. The method generates a final noise power estimate by averaging values of the initial set of magnitude squared values that are less than the threshold value and removing a thresholding bias from the resulting average.


Find Patent Forward Citations

Loading…