The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Jan. 14, 2014
Inview Technology Corporation, Austin, TX (US);
Matthew A. Herman, Austin, TX (US);
InView Technology Corporation, Austin, TX (US);
Abstract
A methodology for acquiring measurements of a signal at one or more scales of resolution, including: generating modulation patterns based on a predefined measurement matrix; modulating a received signal with the modulation patterns using the signal modulating array to obtain a modulated signal; and acquiring measurements of intensity of the modulated signal. Each modulation pattern is generated by: (a) selecting a corresponding row of the measurement matrix; (b) reordering elements of the selected row according to a permutation to obtain a reordered row; and (c) transferring the reordered row to the signal modulating array so that elements of the reordered row are mapped onto the signal modulating array. The permutation is defined so that a subset of the modulation patterns are coarse patterns that respect a partition of the signal modulating array into an array of superpixels, each superpixel including a respective group of the signal modulating elements.