The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2016

Filed:

Oct. 13, 2014
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventors:

Takashi Hamada, Hachioji, JP;

Akira Yukitake, Kokubunji, JP;

Masaomi Tomizawa, Hachioji, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/222 (2006.01); H04N 5/228 (2006.01); H04N 5/235 (2006.01); G03B 7/00 (2014.01); G03B 13/10 (2006.01); G03B 17/20 (2006.01); G03B 17/18 (2006.01); G03B 13/02 (2006.01); G03B 13/30 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23293 (2013.01); H04N 5/2353 (2013.01);
Abstract

Provided is an image pickup apparatus including an image pickup device, an AE control section, an image pickup control section that makes the image pickup device perform shooting, an EVF for image observation by looking thereinto, and an electronic display section, the electronic display section and the EVF alternatively displaying an image, wherein in exposure control, the AE control section sets a first exposure condition that is the same as an exposure condition for capturing image data for recording when the image is displayed on the electronic display section, and sets a second exposure condition that is different from the first exposure condition when the image is displayed on the EVF.


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