The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Feb. 12, 2014
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Hideyuki Kido, Isehara, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 15/02 (2006.01); H04N 1/00 (2006.01); H04N 1/387 (2006.01); H04N 1/60 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00087 (2013.01); H04N 1/0005 (2013.01); H04N 1/00013 (2013.01); H04N 1/00042 (2013.01); H04N 1/00045 (2013.01); H04N 1/00063 (2013.01); H04N 1/3878 (2013.01);
Abstract
A reading unit, which reads images, reads an image of a predetermined pattern that includes a plurality of marks and is printed on a printing medium by executing scanning relative to the printing medium. Image data acquired by this reading is acquired. Reading adjustment values are specified in accordance with displacement amounts of a plurality of regions with respect to ideal positions. The plurality of regions are formed based on the plurality of patterns included in the acquired image data. Reading processing of a reading mechanism is corrected in accordance with the specified reading adjustment values.