The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2016

Filed:

Apr. 23, 2014
Applicant:

Renesas Electronics Corporation, Kanagawa, JP;

Inventor:

Koichi Kanemoto, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01); H01L 23/495 (2006.01); H01L 23/00 (2006.01); H01L 23/544 (2006.01); H01L 25/065 (2006.01); H01L 23/49 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
H01L 23/49575 (2013.01); H01L 23/49503 (2013.01); H01L 23/49541 (2013.01); H01L 23/49551 (2013.01); H01L 23/49582 (2013.01); H01L 23/544 (2013.01); H01L 24/85 (2013.01); H01L 22/34 (2013.01); H01L 23/49 (2013.01); H01L 23/49568 (2013.01); H01L 25/0655 (2013.01); H01L 2223/5446 (2013.01); H01L 2223/54426 (2013.01); H01L 2224/45144 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/48137 (2013.01); H01L 2224/48247 (2013.01); H01L 2224/48465 (2013.01); H01L 2224/48479 (2013.01); H01L 2224/73265 (2013.01); H01L 2224/78301 (2013.01); H01L 2224/85 (2013.01); H01L 2224/92247 (2013.01); H01L 2924/181 (2013.01);
Abstract

Reliability of a semiconductor device is improved. A method of manufacturing a semiconductor device includes a step of arranging a plurality of semiconductor chips next to each other over a chip mounting surface of a die pad. Further, the method of manufacturing a semiconductor device includes a step of electrically coupling the semiconductor chip and the semiconductor chip via a wire. In this regard, a pad (chip-to-chip connection pad) of the semiconductor chip on a second bonding side in the step of coupling the wire is provided such that it is distantly located from a peripheral portion of a surface of the semiconductor chip.


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