The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Feb. 28, 2013
Applicant:
Sandisk Technologies Inc., Plano, TX (US);
Inventor:
Eugene Jinglun Tam, Saratoga, CA (US);
Assignee:
SanDisk Technologies Inc., Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 72/08 (2009.01); G11C 7/22 (2006.01); G11C 29/02 (2006.01); G06F 13/16 (2006.01); G11C 7/10 (2006.01); G11C 7/04 (2006.01);
U.S. Cl.
CPC ...
G11C 7/222 (2013.01); G06F 13/1689 (2013.01); G11C 29/022 (2013.01); G11C 29/023 (2013.01); G11C 29/028 (2013.01); G11C 7/04 (2013.01); G11C 7/1066 (2013.01); G11C 7/1093 (2013.01); G11C 2207/2254 (2013.01);
Abstract
A delay and calibration circuit for an input/output determines an appropriate delay by trying a range of different delays, and for each delay, determining the number of times that a given data sequence is accurately received. The data sequence may be a command, address, host data, or other data. Appropriate delays may be found for different temperatures.