The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2016

Filed:

Sep. 07, 2012
Applicant:

Maurice K. Chu, Burlingame, CA (US);

Inventor:

Maurice K. Chu, Burlingame, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01);
Abstract

One embodiment of the present invention provides a system for generating a classifier to detect patterns in a data sequence. During operation, the system receives the data sequence, which represents a sequence of measurements of a phenomenon. The system transforms the data sequence into a feature sequence that is of a higher dimensionality than a dimensionality of the data sequence, and the feature sequence is a sequence of feature vectors each created from contiguous members of the data sequence. Next, the system generates a graph where each node of the graph corresponds to a feature vector. The system converts the generated graph into a two-dimensional graph. Subsequently, the system displays, to a user, the two-dimensional graph. The system receives user input indicating that a region of the two-dimensional graph corresponds to a pattern associated with the feature sequence, and then generates a classifier based on the received user input.


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