The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2016

Filed:

Aug. 05, 2014
Applicant:

National Taiwan University of Science and Technology, Taipei, TW;

Inventor:

Tzung-Han Lin, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 3/00 (2006.01); G01B 11/25 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 3/0006 (2013.01); G01B 11/2504 (2013.01); G06T 3/00 (2013.01); G06T 7/0018 (2013.01); G06T 7/0057 (2013.01); G06T 2207/30204 (2013.01);
Abstract

A method for calibrating a laser measuring apparatus having a laser illumination unit and an image capturing unit includes the following steps. A calibration board having at least one slit gap and a plurality of markers is provided. The relative position between the calibration board and the laser illumination unit is adjusted to allow a slit laser beam emitted by the laser illumination unit to pass through the at least one slit. The calibration board is captured by the image capturing unit to generate a calibration board image. The calibration board image is processed so as to obtain a camera coordinate of each of the markers. A plurality of calibration parameters are calculated according to the camera coordinate and an actual coordinate of each of the markers so as to obtain actual coordinates of an object captured in an object image generated by the laser measuring apparatus.


Find Patent Forward Citations

Loading…