The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Mar. 18, 2013
Samsung Electronics Co., Ltd., Suwon-si, KR;
Hyo Seok Hwang, Seoul, KR;
Huang Xiangsheng, Beijing, CN;
Dong Soo Kim, Hwaseong, KR;
Kyung Shik Roh, Seongnam, KR;
Young Bo Shim, Seoul, KR;
Suk June Yoon, Seoul, KR;
Seung Yong Hyung, Yongin, KR;
Won Jun Hwang, Seoul, KR;
SAMSUNG ELECTRONICS CO., LTD., Gyeonggi-do, KR;
Abstract
An image processing apparatus for searching for a feature point by use of a depth image and a method thereof are provided. The image processing apparatus includes an input unit configured to input a three-dimensional image having depth information, a feature point extraction unit configured to obtain a designated point from an object image extracted from the depth image to obtain a feature point that is located at a substantially farthest distance from the designated point, and to obtain other feature points that are located at substantially farthest distances from feature points that are previously obtained as well as the designated point. The apparatus includes a control unit configured to control the input unit and the feature point extraction unit so that time in estimating a structure of the object is reduced, and a recognition result is enhanced.