The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2016

Filed:

Nov. 30, 2014
Applicant:

Renesas Electronics Corporation, Kawasaki-shi, JP;

Inventors:

Yoshiyuki Amanuma, Kawasaki, JP;

Takanori Miyoshi, Kawasaki, JP;

Assignee:

Renesas Electronics Corporation, Kawasaki-Shi, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 19/00 (2006.01); G06F 21/81 (2013.01); H03K 19/003 (2006.01); G06F 11/10 (2006.01); G06F 21/75 (2013.01); G06F 21/64 (2013.01);
U.S. Cl.
CPC ...
G06F 21/81 (2013.01); G06F 11/10 (2013.01); G06F 21/64 (2013.01); G06F 21/75 (2013.01); H03K 19/003 (2013.01);
Abstract

A method of a semiconductor integrated circuit comprising a logic circuit including n storage elements (n is a positive integer) which can each store 1-bit information and an attack detection circuit, the method including detecting, by an error determination circuit, through a logic operation that k-bit or less errors (k is a positive integer) have occurred in n-bit codes stored in the n storage elements, and detecting, by a light irradiation detection circuit which includes light detection elements, that light has been irradiated to (k+1) or more of the n storage elements. It is determined that the logic circuit has been attacked from outside when the error determination circuit detects an error or the light irradiation detection circuit detects light irradiation.


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