The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2016
Filed:
Oct. 19, 2010
Applicants:
Matthew J. Walker, Willoughby, OH (US);
Mark E. Olszewski, Solon, OH (US);
Inventors:
Matthew J. Walker, Willoughby, OH (US);
Mark E. Olszewski, Solon, OH (US);
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G06F 19/00 (2011.01); A61B 6/03 (2006.01); A61B 6/10 (2006.01);
U.S. Cl.
CPC ...
G06F 19/3406 (2013.01); A61B 6/032 (2013.01); A61B 6/542 (2013.01); A61B 6/545 (2013.01); A61B 6/107 (2013.01);
Abstract
A computing apparatus includes a processor () that evaluates at least one scan parameter of a scan protocol selected for scanning a subject with an imaging system () based on a corresponding scan parameter policy and generates a signal indicative of whether the scan parameter satisfies the scan parameter policy.